Abstract List
My Submissions
4
MSD-YOLO:A Novel Method for Detecting Microscopic Surface Defects in Industrial ProductsDraft Pending

Yan Zhibo, Wang Dongyun, Zhang Teng*, Zhang Xiaodong

#Default Plenary Track

2
Feature extraction method of rolling bearing fault based on VMD optimized by enhanced SSA and envelope analysisDraft Pending

嘉豪 曹, 小栋 张*, 润生 殷, 智淳 马

#Default Plenary Track

1
Modeling and simulation of a novel virtual assembly systemDraft Pending

春雨 魏*, 翔匀 庞

#Plenary Track

    4 Records 1/1
Important Date
  • Conference Date

    Jun 14

    2024

    to

    Jun 16

    2024

  • Jun 16 2024

    Registration deadline

Sponsored By
IEEE Computational Intelligence Society
IEEE Instrumentation and Measurement Society