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Anhui University is pleased to host the fourth International Conference on Sensing, Measurement & Data Analytics in the era of Artificial Intelligence (ICSMD 2024). ICSMD 2024 aims at providing a dedicated forum for researchers, scientists, engineers and practitioners throughout the world to present their latest research findings in the area of sensing technology, measurement methodology, and data analytics approaches in the fast changing era of AI. ICSMD 2024 will include keynote speeches by eminent scholars as well as special, regular and poster sessions. Also, there will be a industry-academia symposium (in Chinese) in ICSMD 2024 to further decrease the gap between the research and engineering practice. All papers will be peer reviewed and acceptance will be based on quality, originality and relevance. 

Call for paper

Important date

1970-01-01 00:00:00
Abstract submission deadline
1970-01-01 00:00:00
Abstract notification of acceptance
1970-01-01 00:00:00
Draft paper submission deadline
1970-01-01 00:00:00
Draft paper acceptance notification
lSignal Transduction Mechanisms
lNovel Sensing Principles and Multi-modal Sensing
lSensor Modelling
lSensors and Actuators
lSensors Characterization
lMEMS and Nano Sensors
lWireless Sensors
lSmart Sensors and Sensor Fusion
lWireless Sensor Networks
lBody Sensor Networks
lInternet of Things
lMeasurement Theory and Methodology
lMeasurement Systems Design, Characterization, and Evaluation
lReal Time Measurements
lBiomedical Measurements
lWearable medical device
lMeasurements in Robotics
lNon-destructive Testing and Evaluation
lData Acquisition Systems
lManagement of Data Uncertainty
lData Processing Techniques
lBig Data Analysis
lCompressive Sensing & Sparse Decomposition
lTime Frequency Analysis
lAI in Measurement
lAI Applications in Engineering
lStandards in Measurement
lEducation in Sensing, Measurement & Data Analytics
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Important Date
  • Conference Date

    Oct 24



    Oct 27


Sponsored By
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
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