Research Progress On Inverse Photoemission Spectroscopy Analysis And Testing Technology
ID:91 View Protection:ATTENDEE Updated Time:2024-10-23 10:34:11 Hits:597 Oral Presentation

Start Time:2024-11-02 11:50(Asia/Shanghai)

Duration:20min

Session:P3 Parallel Session 3 » P3-2Parallel Session 3(November 2 AM)

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Abstract
Inverse photoemission spectroscopy analysis is an important method that can be used to study the electronic structure of the surface of materials. It can obtain the conduction band structure of the material. Combined with photoemission spectroscopy analysis, complete electronic structure information can be obtained. Therefore, the it can be an important scientific instrument for characterizing the fine electronic structure of materials in all energy bands. In recent years, with the continuous development of materials science and surface physics, the demand for highly sensitive and high-resolution inverse photoemission spectroscopy has been increasing. At the same time, the development of inverse photoemission spectroscopy apparatus has also experienced significant development and progress, and significant progress has been made in improving resolution and extending the energy spectrum range. This article first introduces the basic theory of inverse photoemission spectroscopy analysis, then focuses on the development of existing inverse photoemission spectroscopy apparatus, and finally looks forward to the future research focus of inverse photoemission spectroscopy to provide reference for subsequent related research.
Keywords
inverse photoemission spectroscopy,unoccupied electronic states,surface analysis,low energy
Speaker
ZhangSichao
student Xi’an Jiaotong University

Submission Author
ZhangSichao Xi’an Jiaotong University
ChenYu Xi'an Jiaotong University
ZhangChaobo 西安交通大学
TianSiyu Xi'An Jiaotong University
ZhangTiansong Xi'an Jiaotong University
WangYan Xi'an Jiaotong University
TanAo Xi'an Jiaotong University
王双 西安交通大学
BaiJie Xi'an Jiaotong University
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Important Date
  • Conference Date

    Oct 31

    2024

    to

    Nov 03

    2024

  • Sep 30 2024

    Draft paper submission deadline

  • Nov 12 2024

    Registration deadline

Sponsored By
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society