Numerical calculation and experimental reserch of ultraviolet photoelectron yield spectrum of AlGaN photocathode material
ID:97 View Protection:ATTENDEE Updated Time:2024-10-23 10:30:57 Hits:566 Oral Presentation

Start Time:2024-11-02 10:50(Asia/Shanghai)

Duration:20min

Session:P3 Parallel Session 3 » P3-2Parallel Session 3(November 2 AM)

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Abstract
AlGaN photocathode can realize the "solar-blind" ultraviolet detection function with a wavelength response range below 280nm due to its adjustable Al component. Based on the classical three-step emission theory and combined with the solid band theory, the theoretical models of ultraviolet photoelectron yield of reflective and transmissive photocathodes were established and the expressions were derived. The ultraviolet photoelectron yield spectra of AlGaN photocathode in two working modes were calculated and plotted and compared with the experimental results in the literature. The influence of some factors on the ultraviolet photoelectron yield of AlGaN photocathode was analyzed. At the same time, the ultraviolet photoelectron yield spectrum experimental test of single-layer Al0.27Ga0.73N crystal material was completed by simulating the emission layer of reflective AlGaN photocathode using ultraviolet photoelectron spectrum analyzer. The test results show that in the wavelength range of 220-310nm, the ultraviolet photoelectron yield of single-layer Al0.27Ga0.73N crystal material is about 4%-6%, and it begins to drop sharply after the incident light wavelength reaches 310nm.
Keywords
photocathode,AlGaN,photoelectron emission,yield spectrum
Speaker
TongBohao
student Xi’an Jiaotong University

Submission Author
TongBohao Xi’an Jiaotong University
HouXiaohan Xi'an Jiaotong University
GuoYali Xi’an Jiaotong University
WangShuang Xi'an Jiaotong University
BaiJie Xi'an Jiaotong University
ChenYu Xi'an Jiaotong University
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Important Date
  • Conference Date

    Oct 31

    2024

    to

    Nov 03

    2024

  • Sep 30 2024

    Draft paper submission deadline

  • Nov 12 2024

    Registration deadline

Sponsored By
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society