Introduction

International Test Conference, the cornerstone of TestWeek events, is the premier comference dedicated to the electronic test of devices, boards, and systems - covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. AtITC, test and verification professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tools and equipment designers, and test engineers.

Call for paper

Important date

2026-04-18
Draft paper submission deadline
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Important Date
  • Conference Date

    Oct 10

    2026

    to

    Oct 17

    2026

  • Apr 18 2026

    Draft paper submission deadline

  • Oct 17 2026

    Registration deadline

Sponsored By
Lone Star Section
Philadelphia Section
Organized By
Lone Star Section
Philadelphia Section
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