International Test Conference, the cornerstone of TestWeek events, is the premier comference dedicated to the electronic test of devices, boards, and systems - covering the complete cycle from design verification, test, diagnosis, failure analysis, and back to process improvement. AtITC, test and verification professionals can confront the challenges the industry faces, and learn how these challenges are being addressed by the combined efforts of academia, design tools and equipment designers, and test engineers.
Oct 10
2026
Oct 17
2026
Draft paper submission deadline
Registration deadline
2025-09-20 United States San Diego
2025 IEEE International Test Conference
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