Functional Analysis and Standards Research on Electronic Fuses (Semiconductor Fuses)
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Updated Time:2026-09-28 23:34:57 Hits:7
Oral Presentation
Abstract
An electronic fuse (eFuse) implements current limiting or fault interruption through current sensing, control logic, and power-semiconductor switches, and may integrate overvoltage protection, thermal shutdown, inrush-current suppression, reverse-current blocking, and status reporting. Its protection mechanism, recoverability, and system integration differ from those of conventional fuses that operate by melting a fuse element. IEC 60127, IEC 62368-1, UL 2367, and IEC 60947-10 address miniature fuse-links, IC current limiters, solid-state overcurrent protectors, and semiconductor circuit-breakers, respectively; however, they differ in scope and assessment objectives, and no unified product-level framework currently covers board-level low-voltage DC eFuses. By comparing standard clauses and analyzing representative protection modes, this paper discusses the product definition, ratings, protection modes, and test boundaries of eFuses, and proposes a test system centered on continuous-current carrying, overcurrent, short-circuit, repeated operation, and post-test functional verification. The results provide technical support for the development of a national standard and future proposals for international standardization.
Keywords
electronic fuse,solid-state protection,semiconductor switch,overcurrent protection,short-circuit test,international standardization
Submission Author
Guo Yubin
China National Electric Apparatus Research Institute Co.,Ltd.
Sun Ting
China National Electric Apparatus Research Institute Co., Ltd.
Cai Jun
China National Electric Apparatus Research Institute Co.,Ltd.
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