Introduction
ESREF 2014, the 25th anniversary of the European Symposium on Reliability of Electron Devices, Failure Physics and Analysis will take place in Berlin (Germany) from September 29th to October 2nd, 2014. This international symposium continues to focus on recent developments and future directions in quality and reliability management of materials, devices and circuits for micro, nano, and optoelectronics. It provides a European forum for developing all aspects of reliability management and innovative analysis techniques for present and future electronic applications.
Call for paper
Submission Topics
Papers are requested on the following topics:
· Quality and Reliability Assessment Techniques and Methods for Devices and Systems
· Physical Modeling and Simulation for Reliability Prediction
· Advanced Failure Analysis: Defect Detection and Analysis
· Failure Mechanisms of Advanced Processes and Materials
· Failure analysis and Reliability of Advanced and Nanoscale Electronics
· Focused Ion Beam Processes (EFUG)
· Power Devices Reliability
· Packaging and Assembly Reliability
· Organic electronics: OLED, Electronic Ink, TFT
· 3D Metallization
· Nano-electronics, Nano-electronic Materials for Solid State Devices, Solar Cells and Display
· Photonics, Optoelectronics
· Bio-engineering, Bio-electronics, Bio-sensors, Nano-Bio-technologies
All Comments
Important Date
-
Conference Date
Sep 29
2014
toOct 03
2014
-
Oct 03 2014
Registration deadline
Sponsored By
IEEE Electron Devices Society
Contact Information
- Jasmin Kayadelen
- ja******@vde.com
- -**********
- +49*********
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