IEEE International Workshop on Defects, Adaptive Test and Data Analysis (DATA-2014)

It’s all about the DATA. Everything we do in Test relies on data. We use data to identify our good parts, our bad parts, and our weak parts We manipulate test data to detect outliers and reliability risks. We use data to control and adjust future testing. We also use data to record the full history of wafer lots and to track baseline production changes. And of course we have to collect all that data, store it, analyze it, secure it, and syndicate it to authorized consumers. The Organizing Committee for the DATA-2014 Workshop is soliciting papers in the area of semiconductor test data management, analysis, and syndication. Of particular interest are innovations and advancements in: application of “Big Data” analysis techniques to test data, semiconductor test data acquisition methods, data storage and retrieval, security and syndication, analysis methods including data mining, and implementation of adaptive test. Submissions from qualified data management parties outside the semiconductor industry are welcome. Preference will be given to real-world case studies. Ideas or proposals for Embedded Tutorials, Debates, Panel Discussions and Poster style “Spot-Light” presentations describing industrial experiences or research are also invited.