2015 International Symposium on VLSI Design, Automation and Test (VLSI-DAT)

The VLSI-DAT and the VLSI-TSA symposia are proud to create this annual platform for the latest technical exchanges and communications between experts from all over the world. For example, for the 2014 VLSI-DAT not only three leading thinkers in the industry were invited to deliver the joint plenary keynote speeches (including Dr. Ronald M. Martino of Freescale, Dr. Atul Tambe of IBM, and Dr. David Prutchi of Impulse Dynamics), but there were also two carefully planned joint invited sessions on day 1 and day 3 of the conference. Please click the spotlight for more information about the 2014 VLSI-DAT and the VLSI-TSA symposia. The 2015 International Symposium on VLSI Design, Automation and Test (2015 VLSI-DAT) will again be held in the Ambassador Hotel, Hsinchu, Taiwan during April 27-29, 2015. Organized by Industrial Technology Research Institute (ITRI) and technically cooperations with the Institute of Electrical and Electronics Engineers (IEEE), the 2015 VLSI-DAT provides excellent opportunities for close interactions between industrial and scientific researchers via presentations and discussions on innovations and achievements related to VLSI design, automation and test. In 2015, the VLSI-DAT and the VLSI-TSA will be held again in the same week with three-day overlap. In response to the need of interactions between the technology and design communities, delegates registered for either 2015 VLSI-DAT or 2015 VLSI-TSA will be able to attend the program of both symposia. Original unpublished papers are solicited. Accepted papers will be published by the IEEE and be included in IEEE eXplorer after being presented in the symposium. The 2015 VLSI-DAT and VLSI-TSA will feature three joint plenary sessions, two joint invited sessions, along with a luncheon talk. Specifically, the 2015 VLSI-DAT technical sessions including 3 plenary talks, 2 industry sessions, 2 special sessions , 3 parallel tutorials and regular paper presentations. In addition, the Best Paper Award for the 2014 VLSI-DAT Symposium will be presented at the opening of the symposium in 2015, and the Best Paper Award for the 2015 Symposium will again be selected during the conference. More details of the Symposium program will be released in January, 2015.