Introduction

Issues related to on-line testing are increasingly important in modern electronic systems. In particular, the huge complexity of electronic systems has led to growth in reliability needs in several application domains as well as pressure for low cost products. There is a corresponding increasing demand for cost-effective on-line testing techniques. These needs have increased dramatically with the introduction of very deep submicron and nanometer technologies which adversely impact noise margins, process, voltage and temperature variations, aging and wear-out and make integrating on-line testing and fault tolerance mandatory in many modern ICs. The International On-Line Testing Symposium (IOLTS) is an established forum for presenting novel ideas and experimental data on these areas. The symposium also emphasizes on-line testing in the continuous operation of large applications such as wired, cellular and satellite telecommunication, as well as in secure chips. The Symposium is sponsored by the IEEE Council on Electronic Design Automation (CEDA) and the 2015 edition is organized by the IEEE Computer Society Test Technology Technical Council, the University of Athens, and the TIMA Laboratory.

Call for paper

Submission Topics

The topics of interest include (but are not limited to) the following ones:

  1. Reliability issues in nanometer technologies
  2. Radiation effects
  3. Design for reliability
  4. Design for variability
  5. On-line power monitoring and control
  6. On-line current, temperature, etc, monitoring
  7. Secure circuit design
  8. Fault-based attacks and counter measures
  9. Self-checking circuits and coding theory
  10. On-line testing of analog and mixed signal circuits
  11. On-line testing in industry, automotive, railway, avionics, space
  12. On-line testing in the continuous operation of large systems
  13. Field diagnosis, maintainability and reconfiguration
  14. Fault-tolerant and fail-safe systems
  15. Dependability evaluation
  16. Dependable systems design
  17. On-line and off-line built-in self-test
  18. Synthesis of on-line testable circuits
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Important Date

  • Conference Date

    Jul 06

    2015

    to

    Dec 08

    2015

  • Dec 08 2015

    Registration deadline

Sponsored By
IEEE Council on Electronic Design Automation
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