2015 37th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD 2015)

The ESD Association is requesting abstracts for technical papers covering the effects of electrostatic discharge (ESD), electrical overstress (EOS), and static electricity for presentation at the 37th Annual EOS/ESD Symposium, September 27-October 2, 2015 at the Peppermill Resort and Casino, Reno, NV, USA. Papers for the EOS/ESD Symposium should deal with work in the following areas: Advanced CMOS (Analog/Digital) EOS/ESD and Latchup, ESD Protection in Bipolar, RF, High Voltage and BCD Technologies, Numerical Modeling and Simulation for On-Chip ESD Protection, EOS/ESD Failure Analysis, Troubleshooting and Case Studies, Device Testing: Testers, Methods and Correlation Issues, System Level EOS/ESD/EMC, HMM, EOS/ESD Factory Level, Control and Materials Technology, Chip/Module/Package EOS/ESD Electronic Design Automation. Paper submissions should include data and analysis that advance state-of-the-art knowledge, enhance or review general knowledge, or address new topics. The technical program committee especially encourages new areas and fields relevant to EOS and ESD.