2016 IEEE Accelerated Stress Testing & Reliability Conference (ASTR)

The 2016 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from reliability testing. ASTR 2016 is relevant to manufacturers in the aerospace, automotive, consumer electronics, defense, medical, telecommunications and other industries where reliability is a key driver of operational and business success. If your company needs to improve product testing with a goal to improve reliability, reduce warranty costs, improve profits, gain market share, and be more competitive, then the 2016 ASTR Conference is for you.  

Accelerated stress testing is a key tool within a well-structured development program, being able to focus timely opportunities for product improvement and being able to deliver assured product performance. This year's workshop will deliver detailed case studies, best practices, lessons learned and clear insight designed.