2016 International Conference on Design and Technology of Integrated Systems in Nanoscale Era (DTIS)

Topics of the conference include, but are not limited to:
Integrated Systems Design:
·   SOC, SIP design
·   Multiprocessor systems
·   Embedded systems
·   Wireless systems
·   Network on Chip
·   Analog, Mixed Signal and RF systems
·   MEMS and MOEMS systems
·   Low Voltage and Low Power systems
·   Innovative technologies
·   Synthesis (physical, logic)
·   Simulation, Validation and Verification
·   3D integration
·   Hardware Security
·   FPGA design
Integrated Systems Technology:
·   Nanoelectronics
·   Device modeling
·   Material characterization
·   Failure analysis
·   New components
·   Packaging
·   Process technology
·   Reliability issues
·   3D integration
Integrated Systems Testing:
·   Defect and fault modeling
·   Analog and Mixed Signal testing
·   MEMS/MOEMS testing
·   SOC and SIP testing
·   Delay testing
·   Memory testing
·   Fault Simulation, ATPG
·   DFT, BIST and BISR
·   On-line testing and fault tolerant systems
·   ATE issues
·   Alternative test strategies
·   3D testing
·   Test and Security Issues