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Introduction

The 5th International Workshop on Combinatorial Testing (IWCT) focuses on combinatorial testing, a widely applicable generic methodology and technology for software verification and validation. In a combinatorial test plan, all interactions between parameters up to a certain level are covered. For example, in the special case of pairwise testing, for every pair of parameters, every pair of values will appear at least once. Studies show that CT is more efficient and effective than random testing and expert test selection methods. CT has gained significant interest in recent years, both in research and in practice. However, many issues remain unresolved, and much research is still needed in the field.In this workshop, we plan to bring together researchers actively working on combinatorial testing and create a productive and creative environment for sharing and collaboration. The workshop will also serve as a meeting place between academia and industry, uniting academic excellence with industrial experience and needs. This will allow participants from academia to learn about the industrial experience in practical applications of CT to real-life testing problems. Industrial participants will have opportunities to meet the leading scientists in the field and learn of the latest advances and innovations.

Call for paper

Submission Topics

Topics of interest for papers or posters include, but are not limited to:

  • Combinatorial testing workflow
  • Modeling the input space for CT
  • Efficient algorithms to generate t-way test suites, especially involving support of constraints
  • Determination of expected system behavior for each test case
  • Executing CT test suites
  • Combinatorial testing based fault localization
  • Implementation of CT with existing testing infrastructures
  • Handling changes in test requirements
  • Real-world experience in deployment of combinatorial testing
  • Empirical studies and feedback from practical applications of CT
  • Evaluation and ROI metrics to assess the degree of usefulness of CT
  • Methodology used for test space modeling and determination of interaction coverage requirements
  • Discussion of challenges and open problems in the application of CT in industrial settings
  • Applicability of combinatorial testing
  • Comparison and combination of CT with other dynamic verification methods
  • Study of failure records to determine the kind of CT which may have detected faults
  • Combinatorial testing for concurrent and real-time systems
  • Cloud computing systems testing and use of combinatorial methods in cloud architecture
  • Application of CT in other domains, e.g. biotech applications, mechanical engineering, security, etc.
  • Combinatorial testing, feature models, and software product lines
  • Combinatorial and complementing methods
  • Combinatorial analysis of existing test suites
  • Test plan reduction and completeness
  • CT and coverage metrics – combining the two, and studying the relationship between them
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Important Date

  • Apr 10

    2016

    Conference Date

  • Apr 10 2016

    Registration deadline

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