Introduction

The 2016 IEEE Nuclear and Space Radiation Effects Conference will be held July 11 - 15 at the The DoubleTree by Hilton Portland and the Oregon Convention Center in Portland, Oregon. The conference features a technical program consisting of ten technical sessions of contributed papers describing the latest observations in radiation effects, a Short Course on radiation effects offered on July 11, a Radiation Effects Data Workshop, and an Industrial Exhibit. The technical program includes oral and poster sessions. 

Papers on nuclear and space radiation effects on electronic and photonic materials, devices, circuits, sensors, and systems, as well as semiconductor processing technology and design techniques for producing radiation-tolerant (hardened) devices and integrated circuits, will be presented at this meeting of engineers, scientists, and managers. International participation is strongly encouraged.

Call for paper

Submission Topics

Basic Mechanisms of Radiation Effects in Electronic Materials and Devices

  • Single-Event Charge Collection Phenomena and Mechanisms

  • Radiation Transport, Energy Deposition and Dosimetry

  • Ionizing Radiation Effects

  • Materials and Device Effects

  • Displacement Damage

  • Processing-Induced Radiation Effects

 
Radiation Effects on Electronic and Photonic Devices and Circuits

  • Single-Event Effects

  • MOS, Bipolar and Advanced Technologies

  • Isolation Technologies, such as SOI and SOS

  • Optoelectronic and Optical Devices and Systems

  • Methods for Hardened Design and Manufacturing

  • Modeling of Devices, Circuits and Systems

  • Cryogenic or High Temperature Effects

  • Novel Device Structures, such as MEMs and Nanotechnologies

 
Space, Atmospheric, and Terrestrial Radiation Effects 

  • Characterization and Modeling of Radiation Environments

  • Space Weather Events and Effects

  • Spacecraft Charging

  • Predicting and Verifying Soft Error Rates (SER)

 
Hardness Assurance Technology and Testing

  • New Testing Techniques, Guidelines and Hardness Assurance Methodology

  • Unique Radiation Exposure Facilities or Novel Instrumentation Methods

  • Dosimetry

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Important Date

  • Conference Date

    Jul 11

    2016

    to

    Jul 15

    2016

  • Jul 15 2016

    Registration deadline

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