Introduction
The International Workshop on Machine Learning, Pattern Recognition and Applications aims to bring together researchers in the fields of Machine Learning and Pattern Recognition. The workshop will address recent advances in theory, methodologies and various related applications.
It is meant to promote the advancement, discussion and presentation of new research and development in the areas of machine learning, pattern recognition and applications.
Call for paper
Submission Topics
The Workshop topics of interest include (but are not limited to) the following:
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Statistical Learning
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Knowledge Acquisition and Learning
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Knowledge Discovery
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Cooperative Learning
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Support Vector Machines
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Instance Based Learning
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Grammatical Inference
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Computational Learning Theory
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Neural Network Learning
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Object, Character, Graphical and Text Recognition
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Multi-classifiers
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Neural Networks for Pattern Recognition
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Fuzzy Methods for Pattern Recognition
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Syntactical Methods
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Statistical Methods
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Structural Methods
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Logical and Combinatorial Methods
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Classification
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Feature Selection and Extraction
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Clustering, Descriptors, Segmentation, and Filtering
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Matching & Verification
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Computer Vision
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Image Understanding, Description and Recognition
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Machine Learning & Pattern Recognition Applications
All Comments
Important Date
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Conference Date
Jul 18
2016
toJul 22
2016
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Jul 22 2016
Registration deadline
Contact Information
- Prof. Vesna Zeljkovic
- vz******@ieee.org
- 130********
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