Symposium CM4—In Situ Electron Microscopy of Dynamic Materials Phenomena

In recent years, in situ transmission electron microscopy (TEM) has been well recognized as a powerful tool for the study of materials dynamic processes. For instance, it has been possible to reveal structure, property and chemical reactions of materials with high spatial resolution, at a fast speed, in liquid or gas environment, and under external stimuli, such as stress, electric biasing, magnetic field, heating, cathodoluminescence and photon excitation. The advancement in in situ TEM has openned many opportunties in the study of nucleation, growth and assembly of nanomaterials, electrochemical, mechanical, electric and magnetic properties of materials at the atomic or nanometer scale. In addition, multimodal characterization by coupling TEM with other techniques such as X-ray imaging and spectroscopy has also attracted a lot of attention. The goal of this symposium is to bring together a wide range of researchers to discuss using in situ TEM and other related in situ techniques to study various topics, including growth, phase transformation, etching, defects, interfaces, structural correlated catalytic properties, liquid or gas reactions, mechanical behavior, electric and magnetic properties, radiation damage and control, etc.

Abstracts on study of dynamic materials phenomena using in situ TEM including, liquid cell TEM, gas environmental TEM, in situ mechanical testing, multimodal techniques, development of in situ smaple stage or fast electron detector, etc. are solicited.