2017 IEEE Accelerated Stress Testing & Reliability Conference (ASTR)

The 2017 Accelerated Stress Testing and Reliability (ASTR) Conference is focused on highlighting cutting-edge methods to deliver maximum cost-benefits from reliability testing. ASTR 2017 is relevant to manufacturers in the aerospace, automotive, consumer electronics, defense, medical, telecommunications and other industries where reliability is a key driver of operational and business success. If your company needs to improve product testing with a goal to improve reliability, reduce warranty costs, improve profits, gain market share, and be more competitive, then the 2017 ASTR Conference is for you.

Accelerated stress testing is a key tool within a well-structured development program—enabling timely opportunities for product improvement and delivering assured product performance.

ASTR 2017 will be comprised of short sessions, tutorials and will feature exhibits. Topics will include Accelerated testing, degradation methods, effective test, HALT, and field reliability.

Who should attend?
——Anyone who determines how to test for reliability

• Reliability Development Managers

• Sensor Manufacturers

• Test Equipment Manufacturers

• Senior Reliability Engineers

• Test Engineers

• Test Lab Managers

• Quality Engineers

• Reliability Engineers

• Systems & Development Engineers