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Introduction

The last few years have seen dramatic advances in electron microscope resolution, spatial resolution through aberration correction, energy resolution through monochromation, and time resolution through pulsed sources. New windows are opening into structure / property relations in thin films and nanosystems, and materials dynamics during phase changes and under operating environments. Increasingly large datasets are being generated through pixelated detectors and focal series and new methods of image analysis are becoming increasingly important. This symposium will survey these new emerging frontiers that modern microscopes are now able to explore.

Call for paper

Important date

2016-06-16
Abstract submission deadline

Submission Topics

  • Materials dynamics, including clusters, nanoparticles and nanowires

  • High precision measurement of atomic positions for mapping strain, polarization, octahedral tilts

  • Applications of meV energy resolution

  • Ultrafast imaging of dynamical processes

  • In-situ and in-operando imaging of catalyst, battery, and fuel cell materials

  • Nucleation and crystal growth from solutions, melts and vapors

  • Imaging electric fields and magnetism at the atomic level

  • Functional imaging: electron beam induced current, cathodoluminescence

  • Applications of image analytics, statistics and compression

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Important Date
  • Conference Date

    Nov 27

    2016

    to

    Dec 02

    2016

  • Jun 16 2016

    Abstract Submission Deadline

  • Dec 02 2016

    Registration deadline

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