The last few years have seen dramatic advances in electron microscope resolution, spatial resolution through aberration correction, energy resolution through monochromation, and time resolution through pulsed sources. New windows are opening into structure / property relations in thin films and nanosystems, and materials dynamics during phase changes and under operating environments. Increasingly large datasets are being generated through pixelated detectors and focal series and new methods of image analysis are becoming increasingly important. This symposium will survey these new emerging frontiers that modern microscopes are now able to explore.
Materials dynamics, including clusters, nanoparticles and nanowires
High precision measurement of atomic positions for mapping strain, polarization, octahedral tilts
Applications of meV energy resolution
Ultrafast imaging of dynamical processes
In-situ and in-operando imaging of catalyst, battery, and fuel cell materials
Nucleation and crystal growth from solutions, melts and vapors
Imaging electric fields and magnetism at the atomic level
Functional imaging: electron beam induced current, cathodoluminescence
Applications of image analytics, statistics and compression
Nov 27
2016
Dec 02
2016
Abstract Submission Deadline
Registration deadline
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