Introduction

The IEEE International Board Test Workshop is the pre-eminent workshop for board and system level test, including technologies such as: 3D/2.5D test and SoC/NoC. BTW is best known for its interactive, discussion-based format. Presentations are not given formal time limits but generally continue until a robust discussion has ended. BTW was started in 2001 and continued through 2012. We took last year off to change venues, but are back in business this year.

BTW16 is sponsored by the IEEE Philadelphia Section and the High Plains Section, in cooperation with the IEEE Computer Society, IEEE Computer Society Test Technology Technical Council (TTTC) and is supported by the Board Test Technical and Activities Committee (BTTAC).

Call for paper

Important date

2016-07-15
Draft paper submission deadline
2016-09-01
Draft paper acceptance notification
2016-09-06
Final paper submission deadline

Submission Topics

  • Emerging Standards: IEEE 1149.1-2013; IEEE 1149.6; IEEE 1149.10; IEEE1687; IEEE P1838; IEEE 1581; IEEE 1687.1

  • Hot Topics: 2.5D/3D/SoC/NoC test; System/Application level test and debug; Test Security; Counterfeit Detection; The role of data in Board/System Test; High Speed Optics/Photonics; Component to System Correlation

  • Traditional Test Techniques: Inspection; Future of ICT; Built-in/Built-out Test; HW/SW Co-verification/Test/Diagnosis; Test Economics

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Important Date

  • Conference Date

    Sep 13

    2016

    to

    Sep 15

    2016

  • Jul 15 2016

    Draft paper submission deadline

  • Sep 01 2016

    Draft Paper Acceptance Notification

  • Sep 06 2016

    Final Paper Deadline

  • Sep 15 2016

    Registration deadline

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