IEEE International Workshop on Defects, Adaptive Test, Yield and Data

The scope of the DATA workshop once again returns to our common theme, which has always been DATA, specifically, semiconductor test and yield data. We in the semiconductor industry create billions of data points every hour, and we’ve made great strides in capturing, storing, and analyzing these data. As the cost of storage falls, and query and analysis capabilities become ever more powerful, the next horizon for DATA professionals is Real Time Understanding. How quickly can we turn our copious data from wafer sort, final test, in-line defect inspection, etc. into an understanding that leads to immediate or even pre-emptive action? The time and cost pressures we’re facing as an industry make the move towards short-loop process improvement an imperative.

The Organizing Committee for the DATA-2016 Workshop is soliciting papers in the area of semiconductor test, yield analysis, learning, and improvement. Of particular interest are advanced techniques and new tools for approaching Real Time Understanding of yield loss drivers, tester & manufacturing efficiency, & outlier detection in semiconductor manufacturing, including implementation of adaptive test. Preference will be given to real-world case studies.

Ideas or proposals for Embedded Tutorials, Debates, Panel Discussions and Poster style “Spot-Light” presentations describing industrial experiences or research are also invited.