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Introduction

International Conference on Electronic Measurement & Instruments (ICEMI) is the world's premier conference, and is convened every two years. It dedicated to the electronic test of devices, boards and systems----covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.

The IEEE 13th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 20-23 October, 2017, in Yangzhou, China.

International Conference on Electronic Measurement & Instruments（ICEMI）is sponsored by China Instrument and Control Society and held every two years. As the world’s premier conference, ICEMI dedicated to the electronic test of devices, modules and systems which is covering the complete cycle from design verification, test, diagnosis, failure analysis and back to process and design improvement. The purpose of the ICEMI is to provide excellent opportunities for scientists, engineers, and participants throughout the world to present the latest research results and to exchange their views or experience.

Call for paper

Important date

2017-07-30
Draft paper submission deadline
2016-08-30
Draft paper acceptance notification
2017-07-30
Final paper submission deadline

Submission Topics

he IEEE 13th International Conference on Electronic Measurement & Instruments (ICEMI) will be held on 20-23 October, 2017, in Yangzhou, China. Prospective authors are invited to submit  original, unpublished papers describing recent work in any of the following areas，but are not limited to:

Measurement & Test Information Acquisition and Transmission

  • Sensors and Transducers

  • Non-electric Measurement

  • Sensor Network

  • Data Acquisition System and Technology

  • Signal Transmission and Data Bus

  • Networks in Test and Measurement

  • IOT: Internet of Things

  • Cyber Physical System

Measurement & Test Information Processing

  • Sensors Fusion

  • Signal Analysis and Processing

  • Image Processing

  • Measurement System and Theory

  • Measurement Error Theory

  • Virtual Measurement

  • Machine Learning and Pattern Recognition

  • Intelligent Optimization and Applications

  • Data Mining

  • Massive Data Management and Analysis

  • Modeling and Simulation

  • Reconfigurable Computing

Measurement, Instruments & Test

  • Virtual Instrument

  • Microprocessor and Embedded System

  • VLSI Testing and Fault Diagnosis

  • MEMS Instruments and Test System

  • Testability and Built-in-test

  • Electronic Instrument & Measurement System

  • Optical Instrument & Measurement System

  • Precision Instruments & Measurement System

  • Scientific Experiment and Analytic Instrument

  • Educational Instrument & Experimental System

Software Technology

  • Embedded System Software

  • Test System Software

  • Software Test and Reliability

Condition Monitoring and Health Management

  • System Condition Monitoring

  • Component and System Reliability

  • Component and System Fault Diagnosis

  • Prognostics and Health Management

  • System Health Management

Calibration and Traceability

  • Quantum standards to fundamental constants and the international system of units

  • DC/Low Frequency measurement standards and calibration set

  • High Frequency measurement standards and calibration set

  • Calibration for electromagnetic properties of materials

  • Uncertainty evaluation

  • International or regional comparison

Instrument & Measurement in Research & Engineering

 

  • Simulation and Experimental Technology

  • Physical, Chemical and Biological Field

  • Material & Electro-mechanical Engineering

  • Energy and Power Engineering

  • Communication Technology

  • Aerospace & Avionics & Navigation

  • Automobile Engineering

  • Environmental Engineering

  • Biomedical Instrument and Application

  • Bioassay

  • Biometric

  • Industrial Process Control

  • Robots

  • Safety Monitoring Instruments and Systems

Others

Guidlines

The papers will be reviewed by the Technical Program Committee of ICEMI’2017. The authors of accepted full-text papers will be obliged to guarantee that they register for the conference, pay registration fees, attend the conference, and present their papers. All the accepted papers will be published on IEEE Proceedings.

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Important Date

  • Conference Date

    Oct 20

    2017

    to

    Oct 23

    2017

  • Aug 30 2016

    Draft Paper Acceptance Notification

  • Jul 30 2017

    Draft paper submission deadline

  • Jul 30 2017

    Final Paper Deadline

  • Oct 23 2017

    Registration deadline

Sponsored By
IEEE
Organized By
Measurement and Instrument Committee of CIS
Yangzhou University
Chinese Journal of Scientific Instrument
Journal of Electronic Measurement and Instrumentation
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