20th International Conference on Non-Contact Atomic Force Microscopy

NC-AFM 2017 is the 20th international conference on Non-Contact Atomic Force Microscopy (NC-AFM), which is one of the most influential conference series in the field of scanning probe microscopy.
NC-AFM 2017 will focus on the frontier research in all aspects of dynamic force microscopy and related techniques, covering both experimental and theoretical studies of force microscopy-based imaging, spectroscopy, and manipulation under various environments.
The first international conference of NC-AFM was held at Osaka, Japan in 1998, followed by those at Pontresina, Switzerland (1999); Hamburg, Germany (2000); Kyoto, Japan (2001); Montreal, Canada (2002); Dingle, Ireland (2003); Seattle, USA (2004); Bad Essen, Germany (2005); Kobe, Japan (2006); Antalya, Turkey (2007); Madrid, Spain (2008); New Haven, USA (2009); Kanazawa, Japan (2010); Lindau, Germany (2011); Ceský Krumlov, Czech Republic (2012); Maryland, USA (2013) ; Tsukuba, Japan (2014); Cassis, France (2015); Nottingham, UK (2016).