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Introduction

The Technology and Instrumentation in Particle Physics 2017 (TIPP2017) conference will be held in Beijing, the capital of China, from May 22-26. TIPP2017 will be the fourth in this series of international conferences on detectors and instrumentation, held under the auspices of the International Union of Pure and Applied Physics (IUPAP). The TIPP conference series, a science-driven cross-disciplinary conference, started in Tsukuba, Japan in 2009 (TIPP 2009), with the second conference held in Chicago in 2011 (TIPP 2011), and the third in Amsterdam in 2014 (TIPP2014). The conference aims to provide a stimulating atmosphere for scientists and engineers from around the world to discuss the latest developments in the field. It is increasingly important for the field to form industrial partnerships that may lead to transformational new technologies. This medium-sized conference brings together experts from the scientific and industrial communities to discuss current work and to plan for the future. The conference will, as in the past, include plenary invited talks and parallel tracks with contributions outlining state-of-the-art developments in different areas.

Lets meet in the beautiful Beijing for a fruitful conference and we wish you a nice stay. 

Call for paper

Important date

2017-02-10
Abstract submission deadline

Submission Topics

The program focus is on all areas of detector development and instrumentation in particle physics, astro-particle physics and closely related fields, in particular:

  • Accelerator-based high energy physics

  • Non-accelerator particle physics and particle astrophysics

  • Nuclear physics

  • Experiments with synchrotron radiation and neutrons

  • Instrumentation and monitoring of particle and photon beams

  • Applications in photon science, biology, medicine, and engineering

The program will cover the following areas in parallel tracks focusing on the main themes of sensors, experiments, data processing, emerging technologies, and applications to other fields:

  • Experimental detector systems

  • Gaseous detectors

  • Semiconductor detectors

  • Calorimeters

  • Particle identification

  • Photon detectors

  • Dark Matter Detectors

  • Neutrino Detectors

  • Astrophysics and space instrumentation

  • Front-end electronics and fast data transmission

  • Trigger and data acquisition systems

  • Machine Detector Interface and beam instrumentation

  • Backend readout structures and embedded systems

  • Medical Imaging, security and other applications

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Important Date
  • Conference Date

    May 22

    2017

    to

    May 26

    2017

  • Feb 10 2017

    Abstract Submission Deadline

  • May 26 2017

    Registration deadline