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Introduction

This symposium will focus on presenting the latest scientific and engineering breakthroughs to develop cutting edge measurement technologies and intelligent instruments. The symposium will also offer precious opportunities for experts of the field together with research students to discuss many state-of-art techniques on the diverse topics of measurement science and technology. During the symposium, exhibition and industrial forum will be organized to show measurement instruments of the latest technologies by many famous manufacturers worldwide.

Call for paper

Important date

2017-03-15
Abstract submission deadline
2017-03-31
Abstract notification of acceptance
2017-05-01
Draft paper submission deadline

Submission Topics

  • Micro and Nano Metrology

  • In-Process and Online Metrology

  • Management of Measurement Processes

  • Optical Metrology

  • Surface Metrology

  • Machine Vision and Image Processing

  • Intelligent Instruments for Automation

  • Sensors and Actuators

  • Calibration and Machine Tool Performance

  • Material Characterization

  • Education and Training in Metrology

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Important Date
  • Conference Date

    Sep 22

    2017

    to

    Sep 25

    2017

  • Mar 15 2017

    Abstract Submission Deadline

  • Mar 31 2017

    Abstract Notification of Acceptance

  • May 01 2017

    Draft paper submission deadline

  • Sep 25 2017

    Registration deadline