Abstract List
My SubmissionsReliability investigation of AlGaN/GaN HEMTs under reverse-bias stress at 77KAbstract Pending
Qing Zhu*
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
300W 175°C half bridge power building block with SiC MOSFETs for harsh environment applicationsFinal Paper
Saijun Mao*
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Aging of GaN GIT under repetitive short-circuit testsFinal Paper
Jian Zhi FU*
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Proton Irradiation Effects on High Voltage 4H-SiC Junction Barrier Schottky DiodesFinal Paper
Shuai Yang, Qingwen Song*, Xiaoyan Tang, Yimeng Zhang, Hao Yuan, Chao Han, Lei Yuan, Yuming Zhang, Yimen Zhang
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Comparative Study of Power Semiconductor Reliability in Hybrid DC Circuit Breaker: SiC MOSFET versus Si IGBTFinal Paper
Jingcun LIU, Guogang ZHANG*, Lu QI, Qian CHEN, Yingsan GENG, Jianhua WANG
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Thermal performance and reliability of high temperature SiC die attachments on direct cooling stacked Si3N4 substratesFinal Paper
Jingru Dai*, Bassem Mouawad, Jianfeng Li, Mark Johnson
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Reliability investigation of AlGaN/GaN HEMTs under reverse-bias stress at 77KFinal Paper
Qing Zhu, Xiaohua Ma*
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Non-Magnetic Resonant-Type High-Frequency High-Voltage Power Conversion with Silicon Carbide Power Semiconductor DevicesFinal Paper
Chen Yu*, Mao Saijun, Li Chengmin, Li Wuhua, He Xiangning, Jelena Popovic, Jan Ferreira
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
Radiation Effects of 5MeV Proton on Wet Oxidation SiO2/4H-SiC MOS CapacitorFinal Paper
Haojie Li, Qingwen Song*, Yuming Zhang, Xiao-Yan Tang, Dongxun Li
Plenary Track > Harsh environment (e.g. high temperature) operation and reliability
- 9 Records 1/1
Important Date
-
Conference Date
May 17
2018
toMay 19
2018
-
Dec 08 2017
Abstract Submission Deadline
-
Jan 30 2018
Abstract Notification of Acceptance
-
Feb 10 2018
Draft paper submission deadline
-
Feb 10 2018
Final Paper Deadline
-
May 19 2018
Registration deadline
Sponsored By
Organized By
Xidian University
Contact Information
- Dr. Xiaotian Zhang
- xi******@xjtu.edu.cn
- 029********
Previous Conferences
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2025-08-15 China Beijing
2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia -
2025-08-15 China Beijing
The 2025 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia -
2023-08-27 Taiwan, China Hsinchu
2023 IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia -
2021-08-25 China Wuhan
IEEE Workshop on Wide Bandgap Power Devices and Applications in Asia
