Abstract List
My Submissions
194
Research on High Voltage Pulse Calibration DeviceAbstract Accepted

Plenary Track > Calibration, Metrology and Standards

193
任意阶次多项式最小二乘拟合不确定计算方法与最佳拟合阶次分析Abstract Accepted

金鑫 许*, 由 强

Plenary Track > Calibration, Metrology and Standards

191
电能表EMS在线测试系统的综合去耦网络研究Abstract Accepted

建波 刘*, 杨 梅, 文强 李, 雪锋 马, 红蕊 闫, 赵 燕

Plenary Track > Calibration, Metrology and Standards

190
高频标准电感器溯源标定方法探讨Abstract Accepted

琼崇 梁*

Plenary Track > Calibration, Metrology and Standards

187
A method of calibrating ATE while testAbstract Accepted

houping zhou*

Plenary Track > Calibration, Metrology and Standards

186
Design of ATE Calibration Device Based on Microelectric Reference MaterialsAbstract Accepted

yong hu*

Plenary Track > Calibration, Metrology and Standards

171
Applications of Programmable Josephson Voltage Standard on Magnetic MeasurementsAbstract Accepted

Zengmin Wang*, Honghui Li, Yuan Gao, Yunfeng Lu, Qing He

Plenary Track > Calibration, Metrology and Standards

169
Comparsion of different kinds of frequency scanning methods used at low temperatureAbstract Accepted

Liu Wenjing*, Zhang Haiyang, Gao Bo, Pan Changzhao, Han Dongxu, Hu Jiangfeng, Song Yaonan, Chen hui, Luo ercang, Laurent pitre, Kong Xiangjie

Plenary Track > Calibration, Metrology and Standards

165
Microvolt Josephson Voltage Standard Using a Dual-Channel Programmable Array Chip Developed at NIMAbstract Accepted

HONGHUI LI*, Wenhui Cao, Zengmin Wang, Jinjin LI, Qing He

Plenary Track > Calibration, Metrology and Standards

159
Calibration of current measuring network for wet contact of leakage current testerAbstract Accepted

Xuefeng Ma*, Wenqiang Li

Plenary Track > Calibration, Metrology and Standards

158
Calibration of lock-in amplifiers in the low-frequency rangeAbstract Accepted

Alessandro Cultrera*, Luca Callegaro, Ngoc Thanh Mai Tran, Massimo Ortolano, Vincenzo D'Elia

Plenary Track > Calibration, Metrology and Standards

156
Remarks on the revised SI SystemAbstract Accepted

Waldemar Nawrocki*

Plenary Track > Calibration, Metrology and Standards

155
The IEEE TC-10 Standards: Update 2019Draft Pending

Sergio Rapuano*, Luca De Vito, John Jendzurski, William B. Boyer, Steven J. Tilden, Nicholas G. Paulter

Plenary Track > Calibration, Metrology and Standards

150
Measurement Procedure For External Magnetic Field in UME Kibble BalanceDraft Pending

Haji Ahmedov*, Beste Korutlu, Lev Dorosinskiy, Recep Orhan

Plenary Track > Calibration, Metrology and Standards

148
Amplitude estimation using three-parameter sine fitting algorithm in the Planck-BalanceDraft Pending

Shan Lin*, Christian Rothleitner, Norbert Rogge

Plenary Track > Calibration, Metrology and Standards

Important Date
  • Conference Date

    Sep 17

    2019

    to

    Sep 19

    2019

  • Mar 17 2019

    Draft paper submission deadline

  • Apr 30 2019

    Draft Paper Acceptance Notification

  • May 31 2019

    Final Paper Deadline

  • Sep 19 2019

    Registration deadline

Contact Information