2021 IEEE Microelectronics Design & Test Symposium (MDTS)

Operation Committee

Eugene Atwood – IBM
Kelly Okunzzi – Marvell Semi
Danella Zhao – Old Dominion Univ.
Malinky Ghosh – IBM
Andy Laidler – ON Semi 
Ryan Patterson – CACI
Carl Wisnesky – Cadence
Krishna Chakravadhanula – Cadence
Yu Zhang – Aptiv
Charles Thangaraj – Roger Williams Univ.
Themistoklis Haniotakis – S. Illinois Univ.
Patrick Girad – LIRMM, France

Technical Program Committee

Dave Armstrong – Advantest
R.Iris Bahar – Brown Univ.
Michael Brown – Mentor Graphics               
Hari Chauhan – Analog Devices             
Fen Guan – Global Foundries
Ujjwal Guin – Auburn Univ.
Ian Harris – UC Irvine
Michael Hsiao ­– Virginia Tech.
Yu Huang – HiSilicon
Naghmeh Karimi – Univ. Maryland             
Sandip Kundu – NSF/UMASS Amherst
Qing Lin – Broadcom
JienChung Lo – U. Rhode Island
Xijiang Lin – Mentor Graphics
James Lloyd – SUNY PolyTech
Michail Maniatakos – NYU                    
Zainalabedin Navabi – WPI
Nicola Nicolici – McMaster Univ.
Sudhakar Reddy – University of Iowa
Jeffrey Roehr – Test Consultant
Virendra Singh – IIT – Bombay
Rahul Singhal – Mentor Graphics
Mustapha Slamani – Global Foundries
Uma Srinivasan – IBM Corp.
John Suarez – Widener Univ.
Haralampos G. Stratigopoulos, CNRS
Mike Tehranipoor – U. of Florida
Ramesh Tekumalla – Avago Tech
Andres Veneris – U. of Toronto           
Xingguo Xiong – U. of Bridgeport
Qiaoyan Yu – Univ. of New Hampshire
Zeljko Zilic – McGill Univ.

Steering Committee

Vishwani Agrawal – Auburn Univ.
Xinghao Chen – IEEE
Ted Cooley
Jennifer Dworak – Southern Methodist Univ.
Brion Keller – Lockheed Martin
Martin Margala – UMass Lowell
Colin McDonough – IEEE
Karen Panetta – Tufts Univ.
Paul Reuter – Mentor Graphics
Charles Rubenstein – IEEE
Peilin Song – IBM
Tian Xia – U. of Vermont