Timetable

Timezone：Asia/Shanghai

Day 2,Nov. 01, 2024Friday

P5-1

Parallel Session 5（November 1 PM）@Parallel Session 5

01 Nov 2024, 14:00-18:00

Offline Conference Oral Session

Timetable V13 Updated：28 Oct 2024, 09:57

Start End Duration ID Title
14:00 14:20 20 98
Interpretable feature graph response and inference network for complex defect detection of flip chip
ZhangSiyu research associate/Shanghai Jiao Tong university
Oral Presentation
14:20 14:40 20 50
A Dual-Constraint Centroid Contrastive Prototypical Network for Flip Chip Defect Detection Under Limited Labeled Data
LouYunxia Graduate Student/Jiangnan University
Oral Presentation
14:40 15:00 20 75
Capacitor array bonding defect detection based on active infrared thermography
HuangYifan Student/Huazhong University of Science and Technology
Oral Presentation
15:00 15:20 20 81
An alternating frequency driven electromagnetic fusion system for flow measurement
YaoZe Student/Xi’an Jiaotong University
Oral Presentation
15:20 15:40 20 83
Correlation and Interference of Velocity Measurement in Electrical Capacitance Tomography
WangXiaojie none/Xi'an Jiaotong University
Oral Presentation
15:40 16:00 20 Break
16:00 16:20 20 27
Research on Internal Defect Detection Method of Lithium-ion Battery Based on Ultrasonic Phase-array C-scan Technique
LIUXUAN PhD Student/Beijing University of Technology
Oral Presentation
16:20 16:40 20 101
Research on testing of the proton conduction resistance for the PEMWE
张昊 Master Degree studen/sjtu
Oral Presentation
16:40 17:00 20 45
A Weighted Feature Fusion-Based SOH Assessment for Lithium-ion Batteries
XuJiaxiu student/西安交通大学
Oral Presentation
17:00 17:20 20 17
Multi-sensor data fusion and augmentation for imbalanced fault diagnosis of bearings
FanZhongding Mr./Anhui University
Oral Presentation
Important Date

  • Conference Date

    Oct 31

    2024

    to

    Nov 03

    2024

  • Sep 30 2024

    Draft paper submission deadline

  • Nov 12 2024

    Registration deadline

Sponsored By
Anhui University
Xi’an Jiaotong University
Harbin Institute of Technology
IEEE Instrumentation & Measurement Society
Contact Information
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