Introduction
The IEEE VLSI Test Symposium (VTS) explores emerging trends and novel concepts in testing, debug and repair of microelectronic circuits and systems.
The VTS Program Committee invites original, unpublished paper submissions for VTS 2013. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status.
Call for paper
Submission Topics
Major topics include, but are not limited to:
Analog, Mixed-Signal & RF Test
ATPG & Compression
ATE Architecture & Software
Built-In Self-Test (BIST)
Defect & Current Based Test
Defect/Fault Tolerance
Delay & Performance Test
Design fo
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Important Date
-
Conference Date
Apr 29
2013
toMay 02
2013
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May 02 2013
Registration deadline
Sponsored By
IEEE Computer Society
Contact Information
- Yervan Zorian
- Ye******@synopsys.com
- +1 *********
Previous Conferences
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2024-04-22 United States Tempe
2024 IEEE 42nd VLSI Test Symposium -
2023-04-23 United States San Diego
2023 IEEE 41st VLSI Test Symposium -
2021-04-25
2021 IEEE 39th VLSI Test Symposium -
2019-04-23 United States
2019 IEEE 37th VLSI Test Symposium -
2018-04-22 United States
2018 IEEE 36th VLSI Test Symposium -
2017-04-09 United States Las Vegas, Nevada, USA
2017 35th IEEE VLSI Test Symposium -
2016-04-25 United States Las Vegas, NV, USA
2016 IEEE 34th VLSI Test Symposium -
2014-04-13 United States
2014 IEEE 32nd VLSI Test Symposium
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