Introduction

The VTS Program Committee invites original, unpublished paper submissions for VTS 2016. Paper submissions should be complete manuscripts, up to six pages (inclusive of figures, tables, and bibliography) in a standard IEEE two-column format; papers exceeding the page limit will be returned without review. Authors should clearly explain the significance of the work, highlight novel features, and describe its current status. On the title page, please include: author name(s) and affiliation(s), and the mailing address, phone number, and e-mail address of the contact author. A 50-word abstract and five keywords identifying the topic area are also required.

 

Proposals for the Innovative Practices and Special Sessions tracks are also invited. The innovative practices track highlights cutting-edge challenges faced by test practitioners, and innovative solutions employed to address them. Special sessions can include panels, embedded tutorials, or hot topic presentations. Innovative practices and special session track proposals should include a title, name and contact information of the session organizer(s), a 150-to-200 word abstract, and a list of prospective participants.

Call for paper

Submission Topics

VTS TOPICS

  • Analog/Mixed-Signal/RF Test
  • ATPG & Compression
  • ATE Architecture & Software
  • Automotive Test & Safety
  • Built-In Self-Test (BIST)
  • Defect & Current Based Test
  • Defect/Fault Tolerance
  • Delay & Performance Test
  • Design for Testability (DFT)
  • Design Verification/Validation
  • Embedded System & Board Test
  • Embedded Test Methods
  • Emerging Technologies Test
  • FPGA Test
  • Fault Modeling and Simulation
  • Hardware Security
  • Low-Power IC Test
  • Microsystems/MEMS/Sensors Test
  • Memory Test and Repair
  • On-Line Test & Error Correction
  • Power/Thermal Issues in Test
  • System-on-Chip (SOC) Test
  • Test Standards
  • Test Economics
  • Test of Biomedical Devices
  • Test of High-Speed I/O
  • Test Quality and Reliability
  • Test Resource Partitioning
  • Transients and Soft Errors
  • 2.5D, 3D and SiP Test
Submit Comment
Verify Code Change Another
All Comments
Important Date
  • Conference Date

    Apr 25

    2016

    to

    Apr 27

    2016

  • Apr 27 2016

    Registration deadline

Contact Information
Previous Conferences