Fourth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits

Sep. 12 - 13, 2013

· United States

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Important Date

Conference Date

Sep 12

2013

to

Sep 13

2013
Sep 13 2013

Registration deadline

Sponsored By

IEEE Computer Society

Contact Information

Yervant Zorian
ye******@synopsys.com
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Previous Conferences

2016-11-15 United States Fort Worth,USA
Seventh IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits – 3D-Test Workshop
2014-10-23 United States
Fifth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits