Fifth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits

Oct. 23 - 24, 2014

· United States

Conference Offline Conference

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Important Date

Conference Date

Oct 23

2014

to

Oct 24

2014
Sep 17 2014

Draft paper submission deadline
Oct 24 2014

Registration deadline

Sponsored By

IEEE Computer Society

Contact Information

Yervant Zorian
ye******@synopsys.com
-**********
+1(*********

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Previous Conferences

2016-11-15 United States Fort Worth,USA
Seventh IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits – 3D-Test Workshop
2013-09-12 United States
Fourth IEEE International Workshop on Testing Three-Dimensional Stacked Integrated Circuits