Introduction

The scope of the conference is electronic-based circuits and system testing, including VLSI Test, VLSI Reliability, Yield, diagnosis, DFX, Verification, etc.

Call for paper

Important date

2018-12-12
Abstract submission deadline
2018-12-17
Draft paper submission deadline
2019-02-20
Draft paper acceptance notification
2019-03-20
Final paper submission deadline
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Important Date

  • Conference Date

    May 27

    2019

    to

    May 31

    2019

  • Dec 12 2018

    Abstract Submission Deadline

  • Dec 17 2018

    Draft paper submission deadline

  • Feb 20 2019

    Draft Paper Acceptance Notification

  • Mar 20 2019

    Final Paper Deadline

  • May 31 2019

    Registration deadline

Organized By
KIT - Karlsruhe Institute of Technology
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