Introduction

The IEEE European Test Symposium (ETS) is Europe’s premier forum dedicated to presenting and discussing scientific results, emerging ideas, practical applications, hot topics and new trends in the area of electronic-based circuits and system testing. In 2013 ETS will take place in the Congress Center of the Popes’ Palace in the beautiful city of Avignon, France

Call for paper

Submission Topics

You are invited to participate and submit contributions to ETS'13. The areas of interest include (but are not limited to) the following topics. Analog Test ATE Hardware and Software Automatic Test Generation Board Test and Diagnosis Boundary Scan Test Bu
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Important Date

  • Conference Date

    May 27

    2013

    to

    May 30

    2013

  • May 30 2013

    Registration deadline

Sponsored By
IEEE Computer Society
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