Introduction
The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.
Call for paper
Submission Topics
Original papers on, but not limited to, the following areas are invited.
Automatic Test Pattern Generation
Fault Modeling and Simulation
Design Verification and Validation
Diagnosis and Debug
Board and System Test
Analog/Mixed-Signal Test
High-Sp
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Important Date
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Conference Date
Nov 18
2013
toNov 21
2013
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Nov 21 2013
Registration deadline
Sponsored By
国立台湾大学
IEEE Computer Society
IEEE Computer Society
Contact Information
- Emma Tseng
- mi******@poetry-life.com
- +88*********
Previous Conferences
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2024-12-17 India Ahmedabad
The 33rd IEEE Asian Test Symposium (ATS 2024) -
2023-10-14 China Beijing
2023 IEEE 32nd Asian Test Symposium -
2022-11-21 Taiwan, China Taichung City
2022 IEEE 31st Asian Test Symposium -
2018-10-15 China Hefei
2018 IEEE 27th Asian Test Symposium -
2017-11-27 China Taipei,China
2017 IEEE 26th Asian Test Symposium -
2016-11-21 Japan Hiroshima,Japan
2016 IEEE 25th Asian Test Symposium
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