Introduction
The Asian Test Symposium (ATS) provides an open forum for researchers and industrial practitioners from all countries of the world, especially from Asia, to exchange innovative ideas on system, board, and device testing with design, manufacturing and field consideration in mind.
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Important date
Submission Topics
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nalog/Mixed-Signal Test
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Automatic Test Generation
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Board Test and Diagnosis
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Boundary Scan Test
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Built-In Self-Test (BIST)
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Defect-Based Test
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Delay and Performance Test
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Dependability and Functional Safety
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Design for Test (DFT)
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Diagnosis and Silicon Debug
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Economic of Test
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Failure Analysis
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Fault Modeling and Simulation
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Fault Tolerance
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GPU Test
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High-Speed I/O Test
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Low-Power IC Test
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Memory Test and Repair
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MEMS Test
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Multi-/Many-core Processor Test
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Nanotechnology Test
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On-line Test
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Power/Thermal/Reliability Issues in Test
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Reconfigurable System Test
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Reliability
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RF Test
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Security and Trust Issues in Test
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Self-Repair
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Sensor Test
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SiP, Stacked, 3D IC Test
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SoC Test
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Standards in Test
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Statistical Learning in Test
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Test Compression
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Test Quality
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Test Synthesis
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Validation and Verification
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Yield Analysis and Enhancement
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Important Date
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Conference Date
Nov 27
2017
toNov 30
2017
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May 01 2017
Abstract Submission Deadline
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May 26 2017
Draft paper submission deadline
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Aug 04 2017
Draft Paper Acceptance Notification
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Sep 22 2017
Final Paper Deadline
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Nov 30 2017
Registration deadline
Sponsored By
IEEE National Taiwan University
Contact Information
Previous Conferences
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2024-12-17 India Ahmedabad
The 33rd IEEE Asian Test Symposium (ATS 2024) -
2023-10-14 China Beijing
2023 IEEE 32nd Asian Test Symposium -
2022-11-21 Taiwan, China Taichung City
2022 IEEE 31st Asian Test Symposium -
2018-10-15 China Hefei
2018 IEEE 27th Asian Test Symposium -
2016-11-21 Japan Hiroshima,Japan
2016 IEEE 25th Asian Test Symposium -
2013-11-18 Taiwan, China
2013 IEEE 22nd Asian Test Symposium
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