Introduction
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
The Asian Test Symposium (ATS) provides an international forum for engineers and researchers from all countries of the world, especially from Asia, to present and discuss various aspects of device, board and system testing with design, manufacturing and field considerations in mind.
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Submission Topics
Major topics include, but are not limited to:
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Automatic Test Pattern Generation (ATPG)
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Analog Test / Mixed-Signal Test
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Boundary Scan Test
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Board and System Test
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Built-In Self-Test
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Design for Testability (DFT)
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Design Verification and Validation
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Defect-Based Testing
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Delay and Performance Test
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Diagnosis and Debug
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Dependable System
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Economics of Test
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Fault Modeling and Simulation
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Fault Tolerance
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High-Speed I/O Test / RF Testing
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Memory Test / FPGA Test
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On-Line Test
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System-on-a-Chip Test
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System-in-package (SiP) / 3D Test
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Software Testing / Software Design for Testing
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Test Compression
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Temperature / Power-aware Test
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Test Quality
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Yield Analysis and Enhancement
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Important Date
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Conference Date
Nov 21
2016
toNov 24
2016
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Nov 24 2016
Registration deadline
Contact Information
Previous Conferences
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2024-12-17 India Ahmedabad
The 33rd IEEE Asian Test Symposium (ATS 2024) -
2023-10-14 China Beijing
2023 IEEE 32nd Asian Test Symposium -
2022-11-21 Taiwan, China Taichung City
2022 IEEE 31st Asian Test Symposium -
2018-10-15 China Hefei
2018 IEEE 27th Asian Test Symposium -
2017-11-27 China Taipei,China
2017 IEEE 26th Asian Test Symposium -
2013-11-18 Taiwan, China
2013 IEEE 22nd Asian Test Symposium
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