ITherm 2017 is the leading international conference for scientific and engineering exploration of thermal, thermo-mechanical and emerging technology issues associated with electronic devices, packages, and systems. ITherm 2017 will be held along with the 67th Electronic Components and Technology Conference (ECTC 2017, www.ectc.net), a premier electronic packaging conference, at the Disney World Resort. Joint registrations are available at a discounted rate. All papers will be peer reviewed by two or more reviewers, and will be published in the ITherm proceedings. Selected papers will be published in a special issue of Journal of Electronics Packaging. All papers will be presented in oral sessions. Students have the opportunity to apply for ITherm travel grants and make an oral presentation and also participate in poster presentation of their paper and compete for poster awards. In addition to paper presentations and vendor exhibits, ITherm 2017 will have panel discussions, keynote lectures by prominent speakers, and professional short courses.
Original papers are solicited in the following general areas of interest (but not limited to):
Thermal-1 Component Level --Track I
Single/Multi-Chip Module, System in Package
3D Packaging, Embedded Cooling
Heat Pipes, Vapor Chambers, Thermosyphons
Heat Spreaders
Hot Spot Cooling
Thermoelectric
Single & Two-Phase Cold Plates
Pumps, Fans
Heat Exchangers, Air Cooling
Thermal-2 System Level --Track II
Data Center, Energy Efficiency
Thermal Storage
Immersion Cooling, Refrigeration
Mobile, Internet of Things, MEMS
Telecommunication Systems
Automotive
Space and Aerospace
Power Electronics
LEDs
Photovoltaics
RF Electronics
Battery
Mechanics & Reliability --Track III
Thermo-mechanical Modeling and Simulation of Devices, Components, Boards, and Systems
Mechanics and Reliability of Solder Joints & Interconnects
Materials Characterization, Processing, Constitutive Models
Failure Mechanics, Fatigue, Damage Modeling
Experimental Techniques for Packaging Deformations, Strains, and Stresses
Shock, Drop, and Vibrational Analysis of Packages, SubSystems, and Systems
TSV / 3D Reliability and Packaging Challenges
Mechanics issues in Assembly and Manufacturing
Emerging Technologies & Fundamentals --Track IV
Numerical Methods from Nano-to-Macro Scale
Experimental Methods from Nano-to-Macro Scale
Nanotechnology incl. 1&2-Dimensional Materials
Thermal Interface Materials, Phase Change Materials
Embedded Cooling
Transistor Technology
Novel Materials and Manufacturing Techniques
Measurement and Instrumentation Techniques
Prognostic Health Management and Reliability Analysis
May 30
2017
Jun 02
2017
Registration deadline
Draft paper submission deadline
2031-05-27 United States Dallas
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