Timetable

Timezone：Asia/Shanghai

Day 3,Aug. 20, 2021Friday

IS3

B4. Diagnosis and Yield Learning@Industrial Session

20 Aug 2021, 11:30-12:30

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V10 Updated：23 Aug 2021, 15:07

Start End Duration ID Title
Session Chairs: Yu Huang, Wu Yang
11:30 11:50 20 18
Diagnosis and Yield Learning
Ruifeng Guo /Synopsys, USA
Oral Presentation
11:50 12:10 20 16
Advancements in Diagnosis and Yield
Sameer Chillarige/Cadence
Oral Presentation
12:10 12:30 20 17
Accuracy and scalability of physically aware diagnosis for yield learning
Wu-Tung Cheng /Siemens Digital Industries Software, USA
Oral Presentation
IS4

B5. Industry Practice in SoC and Memory Test@Industrial Session

20 Aug 2021, 20:00-21:00

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V10 Updated：23 Aug 2021, 15:07

Start End Duration ID Title
Session Chairs: Fan Zhang, Jian Wang
20:00 20:20 20 59
An SRAM Test Quality Improvement Method For Automotive chips
Tuanhui Xu/employees
Oral Presentation
20:20 20:40 20 56
A Dynamic Memory Maintenance Model Based on Physical Architecture
Shixin Xu/Duke Kunshan Universit
Oral Presentation
20:40 21:00 20 70
SoC Testability and Its Application in Life Cycle Management
Yang Liu FAE/HISILICON
Oral Presentation
Important Date

  • Conference Date

    Aug 18

    2021

    to

    Aug 20

    2021

  • May 10 2021

    Draft paper submission deadline

  • Aug 16 2021

    Early Bird Registration

  • Aug 19 2021

    Contribution Submission Deadline

  • Aug 20 2021

    Registration deadline

Sponsored By
IEEE
Tongji University
Chinese Computer Federation
Organized By
Tongji University
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