2021 IEEE International Test Conference in Asia (ITC-Asia 2021)

Aug. 18 - 20, 2021

Shanghai · China

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Timetable

Timezone：Asia/Shanghai

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Day 2,Aug. 19, 2021Thursday

IS1	Start	End	Duration	ID	Title
IS1	B2. The Advancement of 1149.10@Industrial Session 19 Aug 2021, 21:05-20 22:05 ZOOM Conference Enter meeting room Video CONFERENCE Oral Session Timetable V10 Updated：23 Aug 2021, 15:07
Organizer: Yu Huang, Session Chair: Paul Reuter
21:05	21:25	20	71	Requirements of high-speed scan and DFT implementation Fu Haitao DFT technical expert/HISILICON Oral Presentation
21:25	21:45	20	11	Solving test challenges in adopting serial scan for production Ed Seng/Teradyne Inc；Marc Hutner/Teradyne Inc Oral Presentation
21:45	22:05	20	12	Bringing 1149.10 to life J-F Cote/Siemens Digital Industries Software；Geir Eide/Siemens Digital Industries Software Oral Presentation

IS2	Start	End	Duration	ID	Title
IS2	B3. Automotive Test and Reliability@Industrial Session 19 Aug 2021, 22:10-20 23:10 ZOOM Conference Enter meeting room Video CONFERENCE Oral Session Timetable V10 Updated：23 Aug 2021, 15:07
Session Chairs: Yu Huang, Ron Press
22:10	22:30	20	13	Challenges and case-studies in ensuring automotive quality on nanoscale SOCs David Francis/Texas Instruments, USA Oral Presentation
22:30	22:50	20	14	Advanced solutions to address automotive test & reliability challenges Yervant Zorian/Synopsys Oral Presentation
22:50	23:10	20	15	Combining structural and functional monitoring for improving overall safety and reliability of automotive ICs Nilanjan Mukherjee/Siemens Digital Industries Software Oral Presentation

Day 3,Aug. 20, 2021Friday

IS3	Start	End	Duration	ID	Title
IS3	B4. Diagnosis and Yield Learning@Industrial Session 20 Aug 2021, 11:30-12:30 ZOOM Conference Enter meeting room Video CONFERENCE Oral Session Timetable V10 Updated：23 Aug 2021, 15:07
Session Chairs: Yu Huang, Wu Yang
11:30	11:50	20	18	Diagnosis and Yield Learning Ruifeng Guo /Synopsys, USA Oral Presentation
11:50	12:10	20	16	Advancements in Diagnosis and Yield Sameer Chillarige/Cadence Oral Presentation
12:10	12:30	20	17	Accuracy and scalability of physically aware diagnosis for yield learning Wu-Tung Cheng /Siemens Digital Industries Software, USA Oral Presentation

IS4	Start	End	Duration	ID	Title
IS4	B5. Industry Practice in SoC and Memory Test@Industrial Session 20 Aug 2021, 20:00-21:00 ZOOM Conference Enter meeting room Video CONFERENCE Oral Session Timetable V10 Updated：23 Aug 2021, 15:07
Session Chairs: Fan Zhang, Jian Wang
20:00	20:20	20	59	An SRAM Test Quality Improvement Method For Automotive chips Tuanhui Xu/employees Oral Presentation
20:20	20:40	20	56	A Dynamic Memory Maintenance Model Based on Physical Architecture Shixin Xu/Duke Kunshan Universit Oral Presentation
20:40	21:00	20	70	SoC Testability and Its Application in Life Cycle Management Yang Liu FAE/HISILICON Oral Presentation

Important Date

Conference Date

Aug 18

2021

to

Aug 20

2021
May 10 2021

Draft paper submission deadline
Aug 16 2021

Early Bird Registration
Aug 19 2021

Contribution Submission Deadline
Aug 20 2021

Registration deadline

Sponsored By

IEEE
Tongji University
Chinese Computer Federation

Organized By

Tongji University

Contact Information

Prof. Zhang Ying
yi******@tongji.edu.cn

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