2018 IEEE International Conference on Microelectronic Test Structures (ICMTS)

Original papers are solicited presenting new developments in topics relevant to ICMTS, including but not limited to, test structures measurements and results, about: • R&D and manufacture of ICs, MEMS, sensors, actuators, photonics, bioelectronics, etc. • Material – Process – New Technology Characterizations • New devices – Memory Cells – Arrays • DC – Pulsed – RF: measurements techniques and applications • Design Methods – Verification – Metrology • Devices and Circuit Modeling – Parameter Extraction • Matching – Variability • Reliability – Wafer-level / thermal Product Failure Analysis and prediction • Yield Enhancement – Production Process Control • Measurements – Statistical Characterization – Probing – Throughput - Analysis – Strategies • NEW: Within-die circuits for process characterization / monitoring • NEW: Design enablement – Characterization and validation of digital and analog libraries