2014 International Conference on Microelectronic Test Structures (ICMTS)

The 27th International Conference on Microelectronic Test Structures will be held in Udine, Italy, bringing together scientists, technicians, designers and users of characterization techniques and test structures to discuss recent developments and future directions. The conference will take place on March 25-27, 2014, preceded by a one-day Tutorial Short Course on Microelectronic Test Structures on March 24. A Best Paper award will be presented by the Technical Program Committee. An Equipment exhibition relating to electronic devices measurements and characterization techniques will be held during the conference days. Vendors and manufacturers interested to participate can mail Dr. Alain Toffoli (Exhibition chair) The conference will be technically sponsored by the IEEE Electron Devices Society.