Timetable

Timezone：Asia/Shanghai

Day 3,Aug. 20, 2021Friday

SS3

A5. 3D test and 3D DFT@Special Session

20 Aug 2021, 20:00-21:00

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V15 Updated：23 Aug 2021, 15:03

Start End Duration ID Title
Session Chairs: Vivek Chickermane, Senling Wang
20:00 20:20 20 35
3D Test Wrapper Design and Physical Optimization
Vivek Chickermane/Cadence Design Systems；Subhasish Mukherjee /Cadence
Oral Presentation
20:20 20:40 20 36
Testing and Fault-Localization Solutions for Monolithic 3D ICs
Arjun Chaudhuri /Duke University
Oral Presentation
20:40 21:00 20 37
Designing Parallel TAMs for 3D-SICs Based on IEEE Std 1838’s Flexible Parallel Port Leveraging Lessons-Learned on 2D-SOCs
Erik Jan Marinissen Scientific Director/imec
Oral Presentation
SS4

A6. Test Methods Towards Zero Failure Rate for Safety-Critical ICs@Special Session

20 Aug 2021, 21:05-22:25

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V15 Updated：23 Aug 2021, 15:03

Start End Duration ID Title
Session Chairs: Shi-Yu Huang, Dawen Xu
21:05 21:25 20 54
TAIWAN Online: Test AI with AN Codes Online for Automotive Chips
Tsung-Chu Huang Professor/National Changhua University of Education
Oral Presentation
21:25 21:45 20 69
Integrated Scratch Marker for Wafer Defect Diagnosis
Katherine Shu-Min Li/National Sun Yat-Sen University
Oral Presentation
21:45 22:05 20 65
Rigorous Test Flow for PLL to Identify Weak Devices
Shi-Yu Huang/National Tsing Hua University
Oral Presentation
22:05 22:25 20 72
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation Hardening
Charles H.-P. Wen Professor/National Yang Ming Chiao Tung University
Oral Presentation
SS5

B6 Top Papers of ITC’2020@Special Session

20 Aug 2021, 21:05-22:25

ZOOM Conference Enter meeting room

Video CONFERENCE Oral Session

Timetable V15 Updated：23 Aug 2021, 15:03

Start End Duration ID Title
Session Chairs: Haihua Shen, Aibin Yan
21:05 21:25 20 49
Characterization, Modeling and Test of SyntheticAnti-FerromagnetFlip Defect in STT-MRAMs
Wu Lizhou Post Doc./,Delft University of Technology
Invited speech
21:25 22:05 40 43
Industrial Application of IJTAG Standards to the Test of Big-A/little-d Devices – plus Updates to the Latest State of IEEE P1687.2
Hans Martin von Staudt/DIALOG SEMICONDUCTOR
Oral Presentation
22:05 22:25 20 44
Learning A Wafer Feature with One Training Sample
Yueling Jenny Zeng/University of California Santa Barbara
Oral Presentation
Important Date

  • Conference Date

    Aug 18

    2021

    to

    Aug 20

    2021

  • May 10 2021

    Draft paper submission deadline

  • Aug 16 2021

    Early Bird Registration

  • Aug 19 2021

    Contribution Submission Deadline

  • Aug 20 2021

    Registration deadline

Sponsored By
IEEE
Tongji University
Chinese Computer Federation
Organized By
Tongji University
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