Program
Timezone：Asia/Beijing
Program Overview
Important Date
-
Conference Date
Mar 24
2025
toMar 27
2025
-
Oct 25 2024
Draft paper submission deadline
-
Mar 27 2025
Registration deadline
Sponsored By
IEEE Electron Devices Society
Contact Information
Previous Conferences
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2023-03-27 Japan Tokyo
2023 35th International Conference on Microelectronic Test Structure -
2021-04-12 United States Cleveland
2021 IEEE 34th International Conference on Microelectronic Test Structures -
2018-03-19 United States
2018 IEEE International Conference on Microelectronic Test Structures -
2017-03-28 France Grenoble,France
30th International Conference on Microelectronic Test Structures -
2016-03-28 Japan Yokohama
2016 International Conference on Microelectronic Test Structures -
2014-03-24 Italy
2014 International Conference on Microelectronic Test Structures -
2013-03-25 Japan
2013 IEEE International Conference on Microelectronic Test Structures
