Program
Timezone：Asia/Beijing
Program Overview
Important Date
-
Conference Date
Mar 28
2016
toMar 31
2016
-
Mar 31 2016
Registration deadline
Contact Information
- Kiyoshi Takeuchi
- ki******@ieee.org
- +81*********
Previous Conferences
-
2025-03-24 United States San Antonio
2025 IEEE 37th International Conference on Microelectronic Test Structures (ICMTS) -
2023-03-27 Japan Tokyo
2023 35th International Conference on Microelectronic Test Structure -
2021-04-12 United States Cleveland
2021 IEEE 34th International Conference on Microelectronic Test Structures -
2018-03-19 United States
2018 IEEE International Conference on Microelectronic Test Structures -
2017-03-28 France Grenoble,France
30th International Conference on Microelectronic Test Structures -
2014-03-24 Italy
2014 International Conference on Microelectronic Test Structures -
2013-03-25 Japan
2013 IEEE International Conference on Microelectronic Test Structures
