Timetable
Timezone：Asia/Shanghai
Day 2,Aug. 19, 2021Thursday
| PS1 |
Openning and Keynote 1/2/3@Plenary Session(Openning, Keynotes 1-6)19 Aug 2021, 09:00-12:00 ZOOM Conference Enter meeting room Timetable V10 Updated：25 Aug 2021, 11:47 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| 09:00 | 09:30 | 30 | 74 |
OpeningYing Zhang/Tongji University
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| Session Chair: Zebo Peng | ||||
| 09:30 | 10:15 | 45 | 4 |
How to make chip intelligent – from an architecture perspectiveShaojun Wei Professor/Tsinghua University
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| 10:15 | 10:30 | 15 | Cofee Break | |
| Session Chair: Huawei Li | ||||
| 10:30 | 11:15 | 45 | 5 |
Life-Time Reliability for Memory Devices in AI ChipXinLi Gu Chief Architect Reli/Huawei Technology Co., Ltd.
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| 11:15 | 12:00 | 45 | 6 |
Towards Robust AI: A Test PerspectiveQiang Xu Associate Professor/The Chinese University of Hong Kong
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| RS1 |
A1. When Machine Learning Meets Testing and Security@Regular Paper Session19 Aug 2021, 20:00-20 21:00 ZOOM Conference Enter meeting room Timetable V8 Updated：23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Jiliang Zhang, He Li | ||||
| 20:00 | 20:20 | 20 | 51 |
Use Machine Learning Based Smart Sampling to Improve System Level Testing EfficiencyChenwei Liu/Huawei Technology Co., Ltd.
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| 20:20 | 20:40 | 20 | 62 |
The ANN Based Modeling Attack and Security Enhancement of the Double-layer PUFYongliang Chen/Peking University Shenzhen Graduate School
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| 20:40 | 21:00 | 20 | 48 |
Fault Modeling and Testing of Spiking Neural Network ChipsI-Wei Chiu/National Taiwan University；Li James Chien Mo/National Taiwan University
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| RS2 |
A2. Fault Monitoring, Detecting, and Modeling@Regular Paper Session19 Aug 2021, 21:05-22:05 ZOOM Conference Enter meeting room Timetable V8 Updated：23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Zhezhi He, Xueyan Wang | ||||
| 21:05 | 21:25 | 20 | 60 |
Developing Formal Models for Measuring Fault Effects Using Functional EDA ToolsLingjuan Wu Associate Proferssor/,huazhong agricultural university
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| 21:25 | 21:45 | 20 | 63 |
Automatic Test Program Generation for Transition Delay Faults in Pipelined ProcessorsJiun-Lang Huang Professor/,National Taiwan University
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| 21:45 | 22:05 | 20 | 58 |
A Duty-Cycle Monitor Supporting A Wide Frequency Range of Clock SignalChen-Lin Tsai/NTHU
|
| SS1 |
B1. Fault Tolerant TSV and Latch Designs@Special Session19 Aug 2021, 20:00-21:00 ZOOM Conference Enter meeting room Timetable V15 Updated：23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Li Jiang, Zhengfeng Huang | ||||
| 20:00 | 20:20 | 20 | 29 |
A Low-Cost Quadruple-Node-Upset Self-Recoverable Latch DesignYan Wen Student/ChangSha university of science and technology
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| 20:20 | 20:40 | 20 | 50 |
Kelvin Bridge Structure Based TSV Test for Weak FaultsHao Chang/Anhui University of Finance & Economics
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| 20:40 | 21:00 | 20 | 47 |
A N:1 Single-Channel TDMA Fault-Tolerant Technique for TSVs in 3D-ICsDanqing Li/HeFei University of Technology
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| SS2 |
A3. Learning based Discovery in ATPG, DfT, and Reverse Engineering@Special Session19 Aug 2021, 22:10-23:10 ZOOM Conference Enter meeting room Timetable V15 Updated：23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Tanvir Arafin, Ying Zhang | ||||
| 22:10 | 22:30 | 20 | 45 |
Scalable Parallel Static LearningXiaoze Lin student/Shantou University
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| 22:30 | 22:50 | 20 | 33 |
An optimized DFT technology based on machine learningHan Yang/Nanjing University of Posts and Telecommunications
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| 22:50 | 23:10 | 20 | 66 |
Identification of Counter Registers through Full Scan ChainQidong Wang/Harbin Institute of Technology, Shenzhen
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| IS1 |
B2. The Advancement of 1149.10@Industrial Session19 Aug 2021, 21:05-20 22:05 ZOOM Conference Enter meeting room Timetable V10 Updated：23 Aug 2021, 15:07 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Organizer: Yu Huang, Session Chair: Paul Reuter | ||||
| 21:05 | 21:25 | 20 | 71 |
Requirements of high-speed scan and DFT implementationFu Haitao DFT technical expert/HISILICON
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| 21:25 | 21:45 | 20 | 11 |
Solving test challenges in adopting serial scan for productionEd Seng/Teradyne Inc；Marc Hutner/Teradyne Inc
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| 21:45 | 22:05 | 20 | 12 |
Bringing 1149.10 to lifeJ-F Cote/Siemens Digital Industries Software；Geir Eide/Siemens Digital Industries Software
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| IS2 |
B3. Automotive Test and Reliability@Industrial Session19 Aug 2021, 22:10-20 23:10 ZOOM Conference Enter meeting room Timetable V10 Updated：23 Aug 2021, 15:07 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Yu Huang, Ron Press | ||||
| 22:10 | 22:30 | 20 | 13 |
Challenges and case-studies in ensuring automotive quality on nanoscale SOCsDavid Francis/Texas Instruments, USA
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| 22:30 | 22:50 | 20 | 14 |
Advanced solutions to address automotive test & reliability challengesYervant Zorian/Synopsys
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| 22:50 | 23:10 | 20 | 15 |
Combining structural and functional monitoring for improving overall safety and reliability of automotive ICsNilanjan Mukherjee/Siemens Digital Industries Software
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Important Date
-
Conference Date
Aug 18
2021
toAug 20
2021
-
May 10 2021
Draft paper submission deadline
-
Aug 16 2021
Early Bird Registration
-
Aug 19 2021
Contribution Submission Deadline
-
Aug 20 2021
Registration deadline
Sponsored By
Tongji University
Chinese Computer Federation
Organized By
Contact Information
- Prof. Zhang Ying
- yi******@tongji.edu.cn
Previous Conferences
-
2022-08-24 Taiwan, China Taipei
2022 IEEE International Test Conference in Asia -
2019-09-03 Japan Tokyo
2019 IEEE International Test Conference in Asia -
2018-08-15 China
2018 IEEE International Test Conference in Asia -
2017-09-13 Taiwan, China Taipei
2017 IEEE International Test Conference in Asia -
2014-11-10 China 杭州市
IEEE International Test Conference in Asia
Contact Information
Tips
Coming soon to a third-party domain
