Aug. 18 - 20, 2021
Shanghai · China
Timezone:Asia/Shanghai
| PS2 |
Keynote 4/5/6@Plenary Session(Openning, Keynotes 1-6)20 Aug 2021, 09:00-18:00 ZOOM Conference Enter meeting room Timetable V10 Updated:25 Aug 2021, 11:47 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Gang Qu | ||||
| 09:00 | 09:45 | 45 | 7 |
Ratio based Resistive RAM for Low Error Rate, High Energy Efficiency and In-Memory ComputingK-T. Tim Cheng Professor/Hong Kong University of Science and Technology
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| 09:45 | 10:30 | 45 | 8 |
Reliability of Carbon-Nanotube FET Circuits: Today’s Challenges and the Road AheadChakrabarty Krishnendu Professor/Duke University
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| 10:30 | 10:45 | 15 | Coffee break | |
| Session Chairs: Shi-Yu Huang | ||||
| 10:45 | 11:30 | 45 | 9 |
Emerging Need for Fast Thermal and Dynamic Voltage Drop Predictors for the Optimization of Scan/Functional Test PatternsNorman Chang Chief Technologist/ANSYS, Inc
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| RS3 |
A4 Circuit Design and Evaluation with Emerging Technology@Regular Paper Session20 Aug 2021, 11:30-12:30 ZOOM Conference Enter meeting room Timetable V8 Updated:23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Qian Wang, Bing Li | ||||
| 11:30 | 11:50 | 20 | 61 |
Parallel DICE Cells and Dual-Level CEs based3-Node-Upset Tolerant Latch Design for Highly Robust ComputingAibin Yan Associate professor/Anhui University
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| 11:50 | 12:10 | 20 | 55 |
High-speed measurement of Piezoelectric MEMS equivalent circuit parameters by Swept-sine and PRBS signalsMitsuo Matsumoto Expert Engineer/Advantest Corporation
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| 12:10 | 12:30 | 20 | 52 |
Reliability Evaluation of Approximate Arithmetic Circuits Based on Signal ProbabilityZhen Wang Associate Professor/Shanghai University of Electric Power
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| SS3 |
A5. 3D test and 3D DFT@Special Session20 Aug 2021, 20:00-21:00 ZOOM Conference Enter meeting room Timetable V15 Updated:23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Vivek Chickermane, Senling Wang | ||||
| 20:00 | 20:20 | 20 | 35 |
3D Test Wrapper Design and Physical OptimizationVivek Chickermane/Cadence Design Systems;Subhasish Mukherjee /Cadence
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| 20:20 | 20:40 | 20 | 36 |
Testing and Fault-Localization Solutions for Monolithic 3D ICsArjun Chaudhuri /Duke University
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| 20:40 | 21:00 | 20 | 37 |
Designing Parallel TAMs for 3D-SICs Based on IEEE Std 1838’s Flexible Parallel PortLeveraging Lessons-Learned on 2D-SOCsErik Jan Marinissen Scientific Director/imec
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| SS4 |
A6. Test Methods Towards Zero Failure Rate for Safety-Critical ICs@Special Session20 Aug 2021, 21:05-22:25 ZOOM Conference Enter meeting room Timetable V15 Updated:23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Shi-Yu Huang, Dawen Xu | ||||
| 21:05 | 21:25 | 20 | 54 |
TAIWAN Online: Test AI with AN Codes Online for Automotive ChipsTsung-Chu Huang Professor/National Changhua University of Education
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| 21:25 | 21:45 | 20 | 69 |
Integrated Scratch Marker for Wafer Defect DiagnosisKatherine Shu-Min Li/National Sun Yat-Sen University
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| 21:45 | 22:05 | 20 | 65 |
Rigorous Test Flow for PLL to Identify Weak DevicesShi-Yu Huang/National Tsing Hua University
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| 22:05 | 22:25 | 20 | 72 |
AMSER-FF: Area-Minimized Soft-Error-Recoverable Flip-Flop for Radiation HardeningCharles H.-P. Wen Professor/National Yang Ming Chiao Tung University
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| SS5 |
B6 Top Papers of ITC’2020@Special Session20 Aug 2021, 21:05-22:25 ZOOM Conference Enter meeting room Timetable V15 Updated:23 Aug 2021, 15:03 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Haihua Shen, Aibin Yan | ||||
| 21:05 | 21:25 | 20 | 49 |
Characterization, Modeling and Test of SyntheticAnti-FerromagnetFlip Defect in STT-MRAMsWu Lizhou Post Doc./,Delft University of Technology
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| 21:25 | 22:05 | 40 | 43 |
Industrial Application of IJTAG Standards to the Test of Big-A/little-d Devices – plus Updates to the Latest State of IEEE P1687.2Hans Martin von Staudt/DIALOG SEMICONDUCTOR
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| 22:05 | 22:25 | 20 | 44 |
Learning A Wafer Feature with One Training SampleYueling Jenny Zeng/University of California Santa Barbara
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| IS3 |
B4. Diagnosis and Yield Learning@Industrial Session20 Aug 2021, 11:30-12:30 ZOOM Conference Enter meeting room Timetable V10 Updated:23 Aug 2021, 15:07 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Yu Huang, Wu Yang | ||||
| 11:30 | 11:50 | 20 | 18 |
Diagnosis and Yield LearningRuifeng Guo /Synopsys, USA
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| 11:50 | 12:10 | 20 | 16 |
Advancements in Diagnosis and YieldSameer Chillarige/Cadence
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| 12:10 | 12:30 | 20 | 17 |
Accuracy and scalability of physically aware diagnosis for yield learningWu-Tung Cheng /Siemens Digital Industries Software, USA
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| IS4 |
B5. Industry Practice in SoC and Memory Test@Industrial Session20 Aug 2021, 20:00-21:00 ZOOM Conference Enter meeting room Timetable V10 Updated:23 Aug 2021, 15:07 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Fan Zhang, Jian Wang | ||||
| 20:00 | 20:20 | 20 | 59 |
An SRAM Test Quality Improvement Method For Automotive chipsTuanhui Xu/employees
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| 20:20 | 20:40 | 20 | 56 |
A Dynamic Memory Maintenance Model Based on Physical ArchitectureShixin Xu/Duke Kunshan Universit
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| 20:40 | 21:00 | 20 | 70 |
SoC Testability and Its Application in Life Cycle ManagementYang Liu FAE/HISILICON
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| CS |
Closing Remark and Best Paper Reward@Closing Remark and Best Paper Reward20 Aug 2021, 22:30-22:45 ZOOM Conference Enter meeting room Session convener:Ying Zhang/Tongji University Timetable V3 Updated:20 Aug 2021, 20:22 |
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| Start | End | Duration | ID | Title |
|---|---|---|---|---|
| Session Chairs: Ying Zhang | ||||
| Closing Remarks and Best Paper Award | ||||
| 22:30 | 22:45 | 15 | 73 |
ITC-Asia 2021 Closing Remark & Best Paper AwardYing Zhang/Tongji University;Huawei Li/University of Chinese Academy of Sciences;Peng Zebo/Linkoping University;Rob Knoth/Cadence;Chang Soon-Jjh/National Cheng Kung University
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Aug 18
2021
Aug 20
2021
Draft paper submission deadline
Early Bird Registration
Contribution Submission Deadline
Registration deadline
2022-08-24 Taiwan, China Taipei
2022 IEEE International Test Conference in Asia2019-09-03 Japan Tokyo
2019 IEEE International Test Conference in Asia2018-08-15 China
2018 IEEE International Test Conference in Asia2017-09-13 Taiwan, China Taipei
2017 IEEE International Test Conference in Asia2014-11-10 China 杭州市
IEEE International Test Conference in Asia